TR2010-041
Increasing Depth Resolution of Electron Microscopy of Neural Circuits Using Sparse Tomographic Reconstruction
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- "Increasing Depth Resolution of Electron Microscopy of Neural Circuits using Sparse Tomographic Reconstruction", IEEE Conference on Computer Vision and Pattern Recognition (CVPR), DOI: 10.1109/CVPR.2010.5539846, June 2010, pp. 1767-1774.BibTeX TR2010-041 PDF
- @inproceedings{Veeraraghavan2010jun,
- author = {Veeraraghavan, A. and Genkin, A.V. and Vitaladevuni, S. and Scheffer, L. and Xu, S. and Hess, H. and Fetter, R. and Cantoni, M. and Knott, G. and Chklovskii, D.},
- title = {Increasing Depth Resolution of Electron Microscopy of Neural Circuits using Sparse Tomographic Reconstruction},
- booktitle = {IEEE Conference on Computer Vision and Pattern Recognition (CVPR)},
- year = 2010,
- pages = {1767--1774},
- month = jun,
- doi = {10.1109/CVPR.2010.5539846},
- url = {https://www.merl.com/publications/TR2010-041}
- }
,
- "Increasing Depth Resolution of Electron Microscopy of Neural Circuits using Sparse Tomographic Reconstruction", IEEE Conference on Computer Vision and Pattern Recognition (CVPR), DOI: 10.1109/CVPR.2010.5539846, June 2010, pp. 1767-1774.
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Research Area:
Abstract:
Future progress in neuroscience hinges on reconstruction of neuronal circuits to the level of individual synapses. Because of the specifics of neuronal architecture, imaging must be done with very high resolution and throughput. While Electron Microscopy (EM) achieves the required resolution in the transverse directions, its depth resolution is a severe limitation. Computed tomography (CT) may be used in conjunction with electron microscopy to improve the depth resolution, but this severely limits the throughput since several tens of hundreds of EM images need to be acquired. Here, we exploit recent advances in signal processing to obtain high depth resolution EM images computationally. First, we show that the brain tissue can be represented as sparse linear combination of local basis functions that are thin membrane-like structures oriented in various directions. We then develop reconstruction techniques inspired by compressive sensing that can reconstruct the brain tissue from very few (typically 5) tomographic views of each section. This enables tracing of neuronal connections across layers and, hence, high throughput reconstruction of neural circuits to the level of individual synapses.
Related News & Events
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NEWS CVPR 2010: 8 publications by C. Oncel Tuzel, Tim K. Marks, Yuichi Taguchi, Srikumar Ramalingam, Michael J. Jones and Amit K. Agrawal Date: June 13, 2010
Where: IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
MERL Contacts: Michael J. Jones; Tim K. MarksBrief- The papers "Optimal Coded Sampling for Temporal Super-Resolution" by Agrawal, A.K., Gupta, M., Veeraraghavan, A.N. and Narasimhan, S.G., "Breaking the Interactive Bottleneck in Multi-class Classification with Active Selection and Binary Feedback" by Joshi, A.J., Porikli, F.M. and Papanikolopoulos, N., "Axial Light Field for Curved Mirrors: Reflect Your Perspective, Widen Your View" by Taguchi, Y., Agrawal, A.K., Ramalingam, S. and Veeraraghavan, A.N., "Morphable Reflectance Fields for Enhancing Face Recognition" by Kumar, R., Jones, M.J. and Marks, T.K., "Increasing Depth Resolution of Electron Microscopy of Neural Circuits using Sparse Tomographic Reconstruction" by Veeraraghavan, A., Genkin, A.V., Vitaladevuni, S., Scheffer, L., Xu, S., Hess, H., Fetter, R., Cantoni, M., Knott, G. and Chklovskii, D., "Specular Surface Reconstruction from Sparse Reflection Correspondences" by Sankaranarayanan, A., Veeraraghavan, A.N., Tuzel, C.O. and Agrawal, A.K., "Fast Directional Chamfer Matching" by Liu, M.-Y., Tuzel, C.O., Veeraraghavan, A.N. and Chellappa, R. and "Robust RVM regression using sparse outlier model" by Mitra, K., Veeraraghavan, A. and Chellappa, R. were presented at the IEEE Conference on Computer Vision and Pattern Recognition (CVPR).